Reduction of power and test time by removing cluster of don't-care from test data set

Reduction of power dissipation and test time is accomplished by forming two clusters of don't-care inside an input and a response test cube, respectively. These clusters are out of the scan operation.

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Bibliographische Detailangaben
Hauptverfasser:	II-Soo Lee, Yu-Ting Lin, Ambler, A.A.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Circuit testing Clocks Data engineering Integrated circuit testing Latches Power dissipation Power engineering and energy Power engineering computing Shape Very large scale integration
Online-Zugang:	Volltext bestellen
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Beschreibung
Zusammenfassung:	Reduction of power dissipation and test time is accomplished by forming two clusters of don't-care inside an input and a response test cube, respectively. These clusters are out of the scan operation.
ISSN:	2159-3469 2159-3477
DOI:	10.1109/ISVLSI.2005.63