Low voltage test in place of fast clock in DDSI delay test

Low voltage test in place of fast clock in DDSI delay test

By testing the CUT at lower supply voltages, the CUT slows down and thus slow, low-cost testers can be used to perform DDSI (defect detection within slack intervals) tests. Apart from this, because the delay fault size is known in a DDSI test, this information can be further used to diagnose the cau...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: Haihua Yan, Gefu Xu, Singh, A.D.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
ATE
Circuit faults
Circuit testing
Clocks
defect
Delay effects
delay test
Design for testability
Fault detection
Low voltage
low voltage test
Performance evaluation
Pins
Signal generators
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Beschreibung
Zusammenfassung:By testing the CUT at lower supply voltages, the CUT slows down and thus slow, low-cost testers can be used to perform DDSI (defect detection within slack intervals) tests. Apart from this, because the delay fault size is known in a DDSI test, this information can be further used to diagnose the causing mechanism behind the delay faults. Experimental results are presented to investigate the potential of the method.
ISSN:1948-3287
1948-3295
DOI:10.1109/ISQED.2005.75