Design of a 3-D fully depleted SOI computational RAM

We introduce a three-dimensional (3-D) processor-in-memory integrated circuit design that provides progressively increasing processing power as the number of stacked dies increases, while incurring no extra design effort or mask sets. Innovative techniques for processor/memory redundancy and fast gl...

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Veröffentlicht in:IEEE transactions on very large scale integration (VLSI) systems 2005-03, Vol.13 (3), p.358-369
Hauptverfasser: Koob, J.C., Leder, D.A., Sung, R.J., Brandon, T.L., Elliott, D.G., Cockburn, B.F., McIlrath, L.
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Sprache:eng
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Zusammenfassung:We introduce a three-dimensional (3-D) processor-in-memory integrated circuit design that provides progressively increasing processing power as the number of stacked dies increases, while incurring no extra design effort or mask sets. Innovative techniques for processor/memory redundancy and fast global bus evaluation are described. The architecture can be augmented with a nearest-neighbor physical 3-D communications network that can substantially reduce interconnect lengths and relieve routing congestion. The test chip, with 128 Kb of memory and 512 processing elements (PEs) on two fully depleted silicon-on-insulator (SOI) dies, can achieve a peak of 170 billion-bit-operations per second at 400 MHz.
ISSN:1063-8210
1557-9999
DOI:10.1109/TVLSI.2004.842890