Loopback or not? (loopback testing)

Loopback or not? (loopback testing)

For the verification of high-speed serial I/O devices, a new architecture, which is different from the conventional ET sampling method, must be developed to measure ultra-wideband jitter in the bit stream transmitted from a multi-Gb/s physical layer IC. For testing in a high-volume test environment,...

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1. Verfasser: Yamaguchi, T.J.
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Integrated circuit testing
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description For the verification of high-speed serial I/O devices, a new architecture, which is different from the conventional ET sampling method, must be developed to measure ultra-wideband jitter in the bit stream transmitted from a multi-Gb/s physical layer IC. For testing in a high-volume test environment, our challenge is to find a way to test the jitter tolerance of Rx that is more effective than the conventional loopback test.
doi_str_mv 10.1109/TEST.2004.1387442
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subjects Integrated circuit testing
title Loopback or not? (loopback testing)
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