Loopback or not? (loopback testing)
For the verification of high-speed serial I/O devices, a new architecture, which is different from the conventional ET sampling method, must be developed to measure ultra-wideband jitter in the bit stream transmitted from a multi-Gb/s physical layer IC. For testing in a high-volume test environment,...
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| Format: | Tagungsbericht |
| Sprache: | eng |
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| Zusammenfassung: | For the verification of high-speed serial I/O devices, a new architecture, which is different from the conventional ET sampling method, must be developed to measure ultra-wideband jitter in the bit stream transmitted from a multi-Gb/s physical layer IC. For testing in a high-volume test environment, our challenge is to find a way to test the jitter tolerance of Rx that is more effective than the conventional loopback test. |
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| DOI: | 10.1109/TEST.2004.1387442 |