An economic analysis and ROI model for nanometer test

This work describes an economic and return-on-investment (RoI) model for a test methodology that ensures product quality for logic devices that are in the 130 nm technology node and below. We describe the key components of the nanometer test methodology (NTM) and how it drives the model. In addition...

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Bibliographische Detailangaben
Hauptverfasser:	Keller, B., Tegethoff, M., Bartenstein, T., Chickermane, V.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Applied sciences Circuit faults Circuit testing Costs Delay effects Electronics Exact sciences and technology Frequency Geometry Leakage current Logic devices Manufacturing Semiconductor device testing Testing, measurement, noise and reliability
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Beschreibung
Zusammenfassung:	This work describes an economic and return-on-investment (RoI) model for a test methodology that ensures product quality for logic devices that are in the 130 nm technology node and below. We describe the key components of the nanometer test methodology (NTM) and how it drives the model. In addition to ensuring product quality we address the cost of test and time to volume and how both factors can be improved. Examples from realistic scenarios are provided to illustrate the net savings from the proposed NTM using this model.
DOI:	10.1109/TEST.2004.1386988