Extending the digital core-based test methodology to support mixed-signal
This work presents an extension to a digital core-based test architecture to support testing of mixed-signal cores in a system-on-chip. It also presents a new mixed-signal test development flow that comprises a test library based approach to ease mixed-signal test development. The new flow was reali...
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| creator | Seuren, G. Waayers, T. |
| description | This work presents an extension to a digital core-based test architecture to support testing of mixed-signal cores in a system-on-chip. It also presents a new mixed-signal test development flow that comprises a test library based approach to ease mixed-signal test development. The new flow was realized and experiments show clear advantages. |
| doi_str_mv | 10.1109/TEST.2004.1386962 |
| format | Conference Proceeding |
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Solid state devices</subject><subject>Signal design</subject><subject>Software libraries</subject><subject>System testing</subject><subject>System-on-a-chip</subject><subject>Time to market</subject><isbn>0780385802</isbn><isbn>9780780385801</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2004</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNpFkE1LxDAYhAMiqOv-APGSi8fWvM3m6yhL1YUFD9bzkqZvupFuW5oIu__eQgXnMjDzMIch5AFYDsDMc1V-VnnB2CYHrqWRxRW5Y0ozroVmxQ1Zx_jNZnEjpRS3ZFeeE_ZN6Fuajkib0IZkO-qGCbPaRmxowpjoCdNxaIZuaC80DTT-jOMwzXE4Y5PF0Pa2uyfX3nYR13--Il-vZbV9z_Yfb7vtyz4LBRMpA6G14qCY5N4YZRmTUjnQbk40GKxt7bgXXNTg0dhCuQ1yD-hqKGojPF-Rp2V3tNHZzk-2dyEeximc7HQ5gJYcuIKZe1y4gIj_9fIK_wXy7lfb</recordid><startdate>2004</startdate><enddate>2004</enddate><creator>Seuren, G.</creator><creator>Waayers, T.</creator><general>IEEE</general><general>International Test Conference</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope><scope>IQODW</scope></search><sort><creationdate>2004</creationdate><title>Extending the digital core-based test methodology to support mixed-signal</title><author>Seuren, G. ; Waayers, T.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i205t-15887317063f997a00667c18c706819ebabc3f535b1fe9a27c4e3f1ecb12b95f3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2004</creationdate><topic>Applied sciences</topic><topic>Circuit testing</topic><topic>Design. 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| identifier | ISBN: 0780385802 |
| ispartof | 2004 International Conferce on Test, 2004, p.281-289 |
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| language | eng |
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| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Applied sciences Circuit testing Design. Technologies. Operation analysis. Testing Electronics Exact sciences and technology Integrated circuit technology Integrated circuit testing Integrated circuits Logic testing Modems Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Signal design Software libraries System testing System-on-a-chip Time to market |
| title | Extending the digital core-based test methodology to support mixed-signal |
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