Extending the digital core-based test methodology to support mixed-signal

This work presents an extension to a digital core-based test architecture to support testing of mixed-signal cores in a system-on-chip. It also presents a new mixed-signal test development flow that comprises a test library based approach to ease mixed-signal test development. The new flow was reali...

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Bibliographische Detailangaben
Hauptverfasser:	Seuren, G., Waayers, T.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Applied sciences Circuit testing Design. Technologies. Operation analysis. Testing Electronics Exact sciences and technology Integrated circuit technology Integrated circuit testing Integrated circuits Logic testing Modems Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Signal design Software libraries System testing System-on-a-chip Time to market
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Beschreibung
Zusammenfassung:	This work presents an extension to a digital core-based test architecture to support testing of mixed-signal cores in a system-on-chip. It also presents a new mixed-signal test development flow that comprises a test library based approach to ease mixed-signal test development. The new flow was realized and experiments show clear advantages.
DOI:	10.1109/TEST.2004.1386962