Compensated layout for automated accurate common-centroid capacitor arrays

Compensated layout for automated accurate common-centroid capacitor arrays

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Hauptverfasser: Khalil, D., Dessouky, M., Bourguet, V., Louerat, M.-M., Cathelin, A., Ragai, H.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Analog circuits
Automatic testing
Capacitance
Capacitors
Circuit testing
Computer Science
Fabrication
Geometry
Laboratories
Research and development
Semiconductor device measurement
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creator Khalil, D.
Dessouky, M.
Bourguet, V.
Louerat, M.-M.
Cathelin, A.
Ragai, H.
description
doi_str_mv 10.1109/ICEEC.2004.1374505
format Conference Proceeding
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identifier ISBN: 0780385756
ispartof ICEEC 2004 - International Conference on Electrical Electronic and Computer Engineering, 2004, p.481-484
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source IEEE Electronic Library (IEL) Conference Proceedings
subjects Analog circuits
Automatic testing
Capacitance
Capacitors
Circuit testing
Computer Science
Fabrication
Geometry
Laboratories
Research and development
Semiconductor device measurement
title Compensated layout for automated accurate common-centroid capacitor arrays
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