Intrinsic diffraction losses in 2D SOI photonic crystal waveguides

Spectral dependence of propagation losses above the light line is measured by a cut-back method in silicon photonic crystal waveguides and is compared to leaky mode propagation in conventional strip waveguides. Features in the experimental data are accurately reproduced by 3D-FDTD calculations

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Hauptverfasser: Vlasov, Yu.A., Moll, N., mcnab, S.J.
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creator Vlasov, Yu.A.
Moll, N.
mcnab, S.J.
description Spectral dependence of propagation losses above the light line is measured by a cut-back method in silicon photonic crystal waveguides and is compared to leaky mode propagation in conventional strip waveguides. Features in the experimental data are accurately reproduced by 3D-FDTD calculations
doi_str_mv 10.1364/IQEC.2004.IThL4
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subjects Diffraction
Finite difference methods
Frequency
Loss measurement
Optical losses
Optical propagation
Photonic crystals
Photonic integrated circuits
Propagation losses
Time domain analysis
title Intrinsic diffraction losses in 2D SOI photonic crystal waveguides
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