Intrinsic diffraction losses in 2D SOI photonic crystal waveguides

Intrinsic diffraction losses in 2D SOI photonic crystal waveguides

Spectral dependence of propagation losses above the light line is measured by a cut-back method in silicon photonic crystal waveguides and is compared to leaky mode propagation in conventional strip waveguides. Features in the experimental data are accurately reproduced by 3D-FDTD calculations

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Bibliographische Detailangaben
Hauptverfasser: Vlasov, Yu.A., Moll, N., mcnab, S.J.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Diffraction
Finite difference methods
Frequency
Loss measurement
Optical losses
Optical propagation
Photonic crystals
Photonic integrated circuits
Propagation losses
Time domain analysis
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Beschreibung
Zusammenfassung:Spectral dependence of propagation losses above the light line is measured by a cut-back method in silicon photonic crystal waveguides and is compared to leaky mode propagation in conventional strip waveguides. Features in the experimental data are accurately reproduced by 3D-FDTD calculations
DOI:10.1364/IQEC.2004.IThL4