Nanomotion measurement by phase conjugate interferometry

A new interferometer design for measuring nanometer-level motion is presented. Experiments show that this new design enables motion measurement at much longer distances than the current state of the art with no loss in accuracy.

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Hauptverfasser: Kurtz, R.M., Pradhan, R.D., Aye, T.M., Savant, G.D., Klein, M.V.
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creator Kurtz, R.M.
Pradhan, R.D.
Aye, T.M.
Savant, G.D.
Klein, M.V.
description A new interferometer design for measuring nanometer-level motion is presented. Experiments show that this new design enables motion measurement at much longer distances than the current state of the art with no loss in accuracy.
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fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_1361597</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1361597</ieee_id><sourcerecordid>1361597</sourcerecordid><originalsourceid>FETCH-ieee_primary_13615973</originalsourceid><addsrcrecordid>eNp9ybEKwjAQgOGACIrmCVzyAoJpSK-ZRXFyci-nXDXFJOWSDnl7HZz9l2_4F0I66LS1YBsAaFdC5jwevhlnDTRr0V0xppCKT1EFwjwzBYpF3auaXphJPVIc5ycWUj4W4oE4BSpct2I54DuT_LkRu_PpdrzsPRH1E_uAXHttWm0dmP_3A-QNMjA</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Nanomotion measurement by phase conjugate interferometry</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Kurtz, R.M. ; Pradhan, R.D. ; Aye, T.M. ; Savant, G.D. ; Klein, M.V.</creator><creatorcontrib>Kurtz, R.M. ; Pradhan, R.D. ; Aye, T.M. ; Savant, G.D. ; Klein, M.V.</creatorcontrib><description>A new interferometer design for measuring nanometer-level motion is presented. Experiments show that this new design enables motion measurement at much longer distances than the current state of the art with no loss in accuracy.</description><identifier>ISBN: 9781557527776</identifier><identifier>ISBN: 1557527776</identifier><language>eng</language><publisher>IEEE</publisher><subject>Distance measurement ; Laser beams ; Lighting ; Mirrors ; Motion measurement ; Nonlinear optics ; Optical interferometry ; Optical mixing ; Optical sensors ; Phase measurement</subject><ispartof>Conference on Lasers and Electro-Optics, 2004. (CLEO), 2004, Vol.1, p.2 pp. vol.1</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1361597$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2056,4048,4049,54919</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1361597$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Kurtz, R.M.</creatorcontrib><creatorcontrib>Pradhan, R.D.</creatorcontrib><creatorcontrib>Aye, T.M.</creatorcontrib><creatorcontrib>Savant, G.D.</creatorcontrib><creatorcontrib>Klein, M.V.</creatorcontrib><title>Nanomotion measurement by phase conjugate interferometry</title><title>Conference on Lasers and Electro-Optics, 2004. (CLEO)</title><addtitle>CLEO</addtitle><description>A new interferometer design for measuring nanometer-level motion is presented. Experiments show that this new design enables motion measurement at much longer distances than the current state of the art with no loss in accuracy.</description><subject>Distance measurement</subject><subject>Laser beams</subject><subject>Lighting</subject><subject>Mirrors</subject><subject>Motion measurement</subject><subject>Nonlinear optics</subject><subject>Optical interferometry</subject><subject>Optical mixing</subject><subject>Optical sensors</subject><subject>Phase measurement</subject><isbn>9781557527776</isbn><isbn>1557527776</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2004</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNp9ybEKwjAQgOGACIrmCVzyAoJpSK-ZRXFyci-nXDXFJOWSDnl7HZz9l2_4F0I66LS1YBsAaFdC5jwevhlnDTRr0V0xppCKT1EFwjwzBYpF3auaXphJPVIc5ycWUj4W4oE4BSpct2I54DuT_LkRu_PpdrzsPRH1E_uAXHttWm0dmP_3A-QNMjA</recordid><startdate>2004</startdate><enddate>2004</enddate><creator>Kurtz, R.M.</creator><creator>Pradhan, R.D.</creator><creator>Aye, T.M.</creator><creator>Savant, G.D.</creator><creator>Klein, M.V.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>2004</creationdate><title>Nanomotion measurement by phase conjugate interferometry</title><author>Kurtz, R.M. ; Pradhan, R.D. ; Aye, T.M. ; Savant, G.D. ; Klein, M.V.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-ieee_primary_13615973</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2004</creationdate><topic>Distance measurement</topic><topic>Laser beams</topic><topic>Lighting</topic><topic>Mirrors</topic><topic>Motion measurement</topic><topic>Nonlinear optics</topic><topic>Optical interferometry</topic><topic>Optical mixing</topic><topic>Optical sensors</topic><topic>Phase measurement</topic><toplevel>online_resources</toplevel><creatorcontrib>Kurtz, R.M.</creatorcontrib><creatorcontrib>Pradhan, R.D.</creatorcontrib><creatorcontrib>Aye, T.M.</creatorcontrib><creatorcontrib>Savant, G.D.</creatorcontrib><creatorcontrib>Klein, M.V.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Kurtz, R.M.</au><au>Pradhan, R.D.</au><au>Aye, T.M.</au><au>Savant, G.D.</au><au>Klein, M.V.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Nanomotion measurement by phase conjugate interferometry</atitle><btitle>Conference on Lasers and Electro-Optics, 2004. (CLEO)</btitle><stitle>CLEO</stitle><date>2004</date><risdate>2004</risdate><volume>1</volume><spage>2 pp. vol.1</spage><pages>2 pp. vol.1-</pages><isbn>9781557527776</isbn><isbn>1557527776</isbn><abstract>A new interferometer design for measuring nanometer-level motion is presented. Experiments show that this new design enables motion measurement at much longer distances than the current state of the art with no loss in accuracy.</abstract><pub>IEEE</pub></addata></record>
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identifier ISBN: 9781557527776
ispartof Conference on Lasers and Electro-Optics, 2004. (CLEO), 2004, Vol.1, p.2 pp. vol.1
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language eng
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source IEEE Electronic Library (IEL) Conference Proceedings
subjects Distance measurement
Laser beams
Lighting
Mirrors
Motion measurement
Nonlinear optics
Optical interferometry
Optical mixing
Optical sensors
Phase measurement
title Nanomotion measurement by phase conjugate interferometry
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-12T06%3A28%3A40IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Nanomotion%20measurement%20by%20phase%20conjugate%20interferometry&rft.btitle=Conference%20on%20Lasers%20and%20Electro-Optics,%202004.%20(CLEO)&rft.au=Kurtz,%20R.M.&rft.date=2004&rft.volume=1&rft.spage=2%20pp.%20vol.1&rft.pages=2%20pp.%20vol.1-&rft.isbn=9781557527776&rft.isbn_list=1557527776&rft_id=info:doi/&rft_dat=%3Cieee_6IE%3E1361597%3C/ieee_6IE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=1361597&rfr_iscdi=true