Compressed embedded diagnosis of logic cores
This paper introduces a new method for deterministic diagnosis of logic cores. The proposed method is based on on-chip decompression and comparison of incompletely specified test patterns and test responses. Using experimental data, the trade-offs between the number of tester channels, on-chip area...
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| creator | Ollivierre, S. Kinsman, A.B. Nicolici, N. |
| description | This paper introduces a new method for deterministic diagnosis of logic cores. The proposed method is based on on-chip decompression and comparison of incompletely specified test patterns and test responses. Using experimental data, the trade-offs between the number of tester channels, on-chip area and scan time are discussed. |
| doi_str_mv | 10.1109/ICCD.2004.1347973 |
| format | Conference Proceeding |
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Solid state devices ; System-on-a-chip ; Test data compression ; Testing, measurement, noise and reliability</subject><ispartof>IEEE International Conference on Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004. 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Technologies. Operation analysis. Testing</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Hardware</topic><topic>Integrated circuits</topic><topic>Isolation technology</topic><topic>Logic</topic><topic>Manufacturing processes</topic><topic>Packaging</topic><topic>Production</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>System-on-a-chip</topic><topic>Test data compression</topic><topic>Testing, measurement, noise and reliability</topic><toplevel>online_resources</toplevel><creatorcontrib>Ollivierre, S.</creatorcontrib><creatorcontrib>Kinsman, A.B.</creatorcontrib><creatorcontrib>Nicolici, N.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection><collection>Pascal-Francis</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Ollivierre, S.</au><au>Kinsman, A.B.</au><au>Nicolici, N.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Compressed embedded diagnosis of logic cores</atitle><btitle>IEEE International Conference on Computer Design: VLSI in Computers and Processors, 2004. 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| ispartof | IEEE International Conference on Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004. Proceedings, 2004, p.534-539 |
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| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Applied sciences Built-in self-test Circuit testing Design. Technologies. Operation analysis. Testing Electronics Exact sciences and technology Hardware Integrated circuits Isolation technology Logic Manufacturing processes Packaging Production Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices System-on-a-chip Test data compression Testing, measurement, noise and reliability |
| title | Compressed embedded diagnosis of logic cores |
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