Online testable reversible logic circuit design using NAND blocks

A technique for an on-line testable reversible logic circuit is presented. Three new reversible logic gates have been introduced in this paper. These gates can be used to implement reversible digital circuits of various levels of complexity. The major feature of these gates is that they provide on-l...

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Bibliographische Detailangaben
Hauptverfasser:	Vasudevan, D.P., Lala, P.K., Parkerson, J.P.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Applied sciences Benchmark testing Circuit properties Circuit testing Computer science Digital circuits Electric, optical and optoelectronic circuits Electronic circuits Electronics Energy dissipation Exact sciences and technology Logic circuits Logic devices Logic gates Logic testing Physics computing
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Beschreibung
Zusammenfassung:	A technique for an on-line testable reversible logic circuit is presented. Three new reversible logic gates have been introduced in this paper. These gates can be used to implement reversible digital circuits of various levels of complexity. The major feature of these gates is that they provide on-line testability for circuits implemented using them. The application of these gates in implementation of a subset of MCNC benchmark circuits is provided.
ISSN:	1550-5774 2377-7966
DOI:	10.1109/DFTVS.2004.1347856