Lucky drift estimation of excess noise factor for conventional avalanche photodiodes including the dead space effect

Lucky drift estimation of excess noise factor for conventional avalanche photodiodes including the dead space effect

A technique for estimating the excess noise factor in conventional avalanche photodiodes has been developed. It is based upon a computer simulation of carrier motion using the lucky drift concept. The importance of the impact ionization dead space is demonstrated, and an established theory is shown...

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Veröffentlicht in:IEEE transactions on electron devices 1992-05, Vol.39 (5), p.1129-1135
Hauptverfasser: Marsland, J.S., Woods, R.C., Brownhill, C.A.
Format: Artikel
Sprache:eng
Schlagworte:
Applied sciences
Avalanche photodiodes
Charge carrier processes
Computer simulation
Diodes
Electronics
Exact sciences and technology
Extraterrestrial phenomena
Impact ionization
Integral equations
Noise reduction
Optical noise
Optoelectronic devices
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Signal to noise ratio
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Beschreibung
Zusammenfassung:A technique for estimating the excess noise factor in conventional avalanche photodiodes has been developed. It is based upon a computer simulation of carrier motion using the lucky drift concept. The importance of the impact ionization dead space is demonstrated, and an established theory is shown to overestimate the excess noise factor due to the neglect of the dead space phenomenon in conventional avalanche photodiodes.< >
ISSN:0018-9383
1557-9646
DOI:10.1109/16.129093