Efficiency of transient bit-flips detection by software means: a complete study

Efficiency of transient bit-flips detection by software means: a complete study

This-paper characterizes the effectiveness of an error detection technique that addresses transient faults induced by the environment (radiation, EMC) in processor-based architectures. Experimental results obtained from fault injection sessions performed on two platforms built around a 32-bit digita...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Nicolescu, B., Peronnard, P., Velazco, R., Savaria, Y.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Application software
Circuit faults
CMOS technology
Digital signal processors
Electromagnetic radiation
Electromagnetic transients
Engineering Sciences
Fault detection
Fault tolerance
Micro and nanotechnologies
Microcontrollers
Microelectronics
Radiation detectors
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:This-paper characterizes the effectiveness of an error detection technique that addresses transient faults induced by the environment (radiation, EMC) in processor-based architectures. Experimental results obtained from fault injection sessions performed on two platforms built around a 32-bit digital signal processor and an 8-bit microcontroller, provide objective figures about the efficiency of the proposed approach.
ISSN:1550-5774
2377-7966
DOI:10.1109/DFTVS.2003.1250134