Structural characterization and magnetization reversal of 0.1 /spl mu/m scale antidot-type arrays patterned by Ga/sup +/ irradiation

In this article, we present conventional transmission electron microscopy (TEM), Lorentz TEM and micromagnetic simulation, the relation between the structural changes accompanying the irradiation process and the magnetisation reversal of magnetic films patterned with arrays of 0.1/spl mu/m scale squ...

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Bibliographische Detailangaben
Hauptverfasser:	Owen, N.W., Petford-Long, A.K.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Atomic layer deposition Electron microscopy Gas insulated transmission lines Magnetic films Magnetic force microscopy Magnetic materials Magnetic properties Magnetization reversal Sputtering Transmission electron microscopy
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Beschreibung
Zusammenfassung:	In this article, we present conventional transmission electron microscopy (TEM), Lorentz TEM and micromagnetic simulation, the relation between the structural changes accompanying the irradiation process and the magnetisation reversal of magnetic films patterned with arrays of 0.1/spl mu/m scale square antidots. The arrays have been fabricated in Co thin film as well as NiFe thin film using a focused ion beam system.
DOI:	10.1109/INTMAG.2003.1230643