X-Gen: a random test-case generator for systems and SoCs

We present X-Gen, a model-based test-case generator designed for systems and systems on a chip (SoC). X-Gen provides a framework and a set of building blocks for system-level test-case generation. At the core of this framework lies a system model, which consists of component types, their configurati...

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Hauptverfasser: Emek, R., Jaeger, I., Naveh, Y., Bergman, G., Aloni, G., Katz, Y., Farkash, M., Dozoretz, I., Goldin, A.
Format: Tagungsbericht
Sprache:eng
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Beschreibung
Zusammenfassung:We present X-Gen, a model-based test-case generator designed for systems and systems on a chip (SoC). X-Gen provides a framework and a set of building blocks for system-level test-case generation. At the core of this framework lies a system model, which consists of component types, their configuration, and the interactions between them. Building blocks include commonly used concepts such as memories, registers, and address translation mechanisms. Once a system is modeled, X-Gen provides a rich language for describing test cases. Through this language, users can specify requests that cover the full spectrum between highly directed tests to completely random ones. X-Gen is currently in preliminary use at IBM for the verification of two different designs - a high-end multi-processor server and a state-of-the-art SoC.
DOI:10.1109/HLDVT.2002.1224444