A silicon gated field edge cathode

In this paper, we discuss the peculiarities of the design and technology of the Silicon Gated Field Edge Cathode on the hole silicon. Such cathodes have been formed with the help of the CMOS technology of plasma etching with the thermal oxidation.

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Bibliographische Detailangaben
Hauptverfasser: Dyuzhev, N.A., Beliaev, S.N., Vlasenko, V.A., Gogin, A.A., Gontar, V.M., Deniskin, V.V., Mazaev, A.A., Nevsky, A.B., Tishin, Y.I., Shokin, A.N.
Format: Tagungsbericht
Sprache:eng
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Zusammenfassung:In this paper, we discuss the peculiarities of the design and technology of the Silicon Gated Field Edge Cathode on the hole silicon. Such cathodes have been formed with the help of the CMOS technology of plasma etching with the thermal oxidation.
DOI:10.1109/IVMC.2003.1223041