Designing for test analog signal processors for MEMS-based inertial sensors

Conceptually, signal processors are systems, with reasonable complexity, were different mathematical operations are performed over signals derived from different origins. This paper presents the preliminary results for a Design for Test Methodology for analog signal processors, which can be used for MEMS and for the basic electronic circuitry around the micromachine core. The methodology is based on an analysis and a synthesis recursive process, which guarantees a good trade-of between extra structures, used to implement built-in self-test features in the original design. Basically, the whole design process is founded over the building of a system, with structural blocks, with a dynamic behavior of 1st and 2nd order.