Influence of the substrate microstructure on the superconducting properties of YBCO coated conductors

The microstructure of Ni-5at%W (Ni-W) and Ni-11at%V (Ni-V) biaxially textured substrates has been investigated using X-ray diffraction (XRD) and electron backscatter diffraction (EBSD). The correlation between the substrate microstructure and superconducting transport properties of YBa/sub 2/Cu/sub...

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Veröffentlicht in:	IEEE transactions on applied superconductivity 2003-06, Vol.13 (2), p.2591-2594
Hauptverfasser:	Celentano, G., Varesi, E., Petrisor, T., Boffa, V., Ciontea, L., Galluzzi, V., Gambardella, U., Mancini, A., Rufoloni, A., Vannozzi, A.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Conductors Critical current density Electronics Electrons Exact sciences and technology Microelectronic fabrication (materials and surfaces technology) Microstructure Oxidation Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Substrates Superconducting films X-ray diffraction X-ray scattering Yttrium barium copper oxide
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