Using life-cycle information for reliability assessment of electronic assemblies

Using life-cycle information for reliability assessment of electronic assemblies

This paper describes the modular concept of a Life-time Information Module (LIM) for reliability assessment and life-time estimation of electronic components. The LIM consists of a data logger and a data processing setup for computing the reliability of individual electronic products, which are subj...

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Bibliographische Detailangaben
Hauptverfasser: Middendorf, A., Griese, H., Reichl, H., Grimm, W.M.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Assembly
Consumer electronics
Data analysis
Failure analysis
Life estimation
Lifetime estimation
Maintenance
North America
Reliability engineering
Testing
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Beschreibung
Zusammenfassung:This paper describes the modular concept of a Life-time Information Module (LIM) for reliability assessment and life-time estimation of electronic components. The LIM consists of a data logger and a data processing setup for computing the reliability of individual electronic products, which are subject to different use conditions. It is designed for realizing novel failure prediction and lifetime estimation methods.
DOI:10.1109/IRWS.2002.1194262