Self-consistent integrated system for susceptibility to terrestrial neutron induced soft-error of sub-quarter micron memory devices

Self-consistent integrated system for susceptibility to terrestrial neutron induced soft-error of sub-quarter micron memory devices

Concerns about Single Event Upset (SEU) induced by terrestrial neutron at the ground are growing as scaling down of semiconductor device proceeds. A highly integrated procedure named SECIS (SElf-Consistent Integrated System for susceptibility to terrestrial neutron soft-error) is proposed to estimat...

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Bibliographische Detailangaben
Hauptverfasser: Yasuo Yahagi, Saito, Y., Terunuma, K., Nunomiya, T., Nakamura, T.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Acceleration
Charge measurement
Current measurement
Earth
Energy measurement
Neutrons
Nuclear measurements
Particle beams
Semiconductor devices
Single event upset
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Zusammenfassung:Concerns about Single Event Upset (SEU) induced by terrestrial neutron at the ground are growing as scaling down of semiconductor device proceeds. A highly integrated procedure named SECIS (SElf-Consistent Integrated System for susceptibility to terrestrial neutron soft-error) is proposed to estimate soft-error rate (SER) at any place on the earth. A good agreement is obtained from SECIS within 35% error between the measured and estimated SERs in three locations in Japan.
DOI:10.1109/IRWS.2002.1194253