An enhanced-performance CMOS imager with a flushed-reset photodiode pixel
A new front-end for photodiode-based CMOS imagers is presented. Degradation in imaging performance due to conventional hard- and soft-reset of pixels is analyzed. To overcome these limitations, the design and operation of a flushed-reset pixel is described. The flushed-reset pixel combines the best...
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Veröffentlicht in: | IEEE transactions on electron devices 2003-01, Vol.50 (1), p.48-56 |
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Sprache: | eng |
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Zusammenfassung: | A new front-end for photodiode-based CMOS imagers is presented. Degradation in imaging performance due to conventional hard- and soft-reset of pixels is analyzed. To overcome these limitations, the design and operation of a flushed-reset pixel is described. The flushed-reset pixel combines the best of hard- and soft-reset to simultaneously provide excellent radiometric accuracy, high linearity, no image lag, high saturation level, and reduced read-noise. The new front-end is implemented by changes to the column-circuitry only, leaving the pixel unchanged, preventing degradation of any unrelated imaging performance. It is compatible with large format imager implementation, has minimal impact on the frame-rate, and does not introduce any additional hot-carrier stress in the pixel. Data from a large format (512/sup 2/) imager demonstrates the efficacy of the flushed-reset pixel approach. |
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ISSN: | 0018-9383 1557-9646 |
DOI: | 10.1109/TED.2002.806969 |