An enhanced-performance CMOS imager with a flushed-reset photodiode pixel

A new front-end for photodiode-based CMOS imagers is presented. Degradation in imaging performance due to conventional hard- and soft-reset of pixels is analyzed. To overcome these limitations, the design and operation of a flushed-reset pixel is described. The flushed-reset pixel combines the best...

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Veröffentlicht in:IEEE transactions on electron devices 2003-01, Vol.50 (1), p.48-56
Hauptverfasser: Pain, B., Guang Yang, Cunningham, T.J., Wrigley, C., Hancock, B.
Format: Artikel
Sprache:eng
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Zusammenfassung:A new front-end for photodiode-based CMOS imagers is presented. Degradation in imaging performance due to conventional hard- and soft-reset of pixels is analyzed. To overcome these limitations, the design and operation of a flushed-reset pixel is described. The flushed-reset pixel combines the best of hard- and soft-reset to simultaneously provide excellent radiometric accuracy, high linearity, no image lag, high saturation level, and reduced read-noise. The new front-end is implemented by changes to the column-circuitry only, leaving the pixel unchanged, preventing degradation of any unrelated imaging performance. It is compatible with large format imager implementation, has minimal impact on the frame-rate, and does not introduce any additional hot-carrier stress in the pixel. Data from a large format (512/sup 2/) imager demonstrates the efficacy of the flushed-reset pixel approach.
ISSN:0018-9383
1557-9646
DOI:10.1109/TED.2002.806969