Measurement of dielectric permittivity tensor, main directions and optical axises in single-axis and bi-axis crystals

Measurement of dielectric permittivity tensor, main directions and optical axises in single-axis and bi-axis crystals

We have designed a method of measuring the permittivity tensor components, permittivity ellipsoid axes and optical axes of uniaxial crystals with tetragonal, hexagonal, trigonal symmetry, as well as biaxial crystals with rhombic symmetry.

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Bibliographische Detailangaben
Hauptverfasser: Zvyagintsev, A.A., Strizhachenko, A.V., Chizhov, V.V.
Format: Tagungsbericht
Sprache:eng ; rus
Schlagworte:
Anisotropic magnetoresistance
Crystals
Dielectric measurements
Electromagnetic waveguides
Geometrical optics
Optical devices
Optical waveguides
Organizing
Permittivity measurement
Tensile stress
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Beschreibung
Zusammenfassung:We have designed a method of measuring the permittivity tensor components, permittivity ellipsoid axes and optical axes of uniaxial crystals with tetragonal, hexagonal, trigonal symmetry, as well as biaxial crystals with rhombic symmetry.
DOI:10.1109/CRMICO.2002.1137348