Fabrication of Through-Wafer Via Conductors in Si by Laser Photochemical Processing
A procedure for the fabrication of high-aspect-ratio through-wafer via conductors in Si is described. The technique is based on a rapid highly anistropic laser etching process followed by a two-step metallization. The surface area occupied by the via on the front, circuit side of the wafer, can be a...
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Veröffentlicht in: | IEEE transactions on components, hybrids, and manufacturing technology hybrids, and manufacturing technology, 1982-12, Vol.5 (4), p.520-521 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | A procedure for the fabrication of high-aspect-ratio through-wafer via conductors in Si is described. The technique is based on a rapid highly anistropic laser etching process followed by a two-step metallization. The surface area occupied by the via on the front, circuit side of the wafer, can be as small as 5 µm x 5 µm. |
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ISSN: | 0148-6411 1558-3082 |
DOI: | 10.1109/TCHMT.1982.1135991 |