Laser-induced and heavy ion-induced single-event transient (SET) sensitivity measurements on 139-type comparators

Laser-induced and heavy ion-induced single-event transient (SET) sensitivity measurements on 139-type comparators

We have measured the single-event transient (SET) response for a number of 139-type comparators with differing topologies. In this paper, we present the results from pulsed laser measurements on a number of different 139-type devices, as well as heavy ion measurements on a new RM139 device from NSC....

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Veröffentlicht in:IEEE transactions on nuclear science 2002-12, Vol.49 (6), p.3121-3128
Hauptverfasser: LaLumondiere, S.D., Koga, R., Yu, P., Maher, M.C., Moss, S.C.
Format: Artikel
Sprache:eng
Schlagworte:
Aerospace testing
Comparators
Devices
Laser excitation
Laser modes
Lasers
Logic devices
Mathematical models
Metallization
Optical pulses
Pulse measurements
Pulsed lasers
SPICE
Spices
Topology
Virtual manufacturing
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Beschreibung
Zusammenfassung:We have measured the single-event transient (SET) response for a number of 139-type comparators with differing topologies. In this paper, we present the results from pulsed laser measurements on a number of different 139-type devices, as well as heavy ion measurements on a new RM139 device from NSC. Devices tested with the laser included the HS-139RH, PM139, LM139 and a more recent version of LM139 from NSC. We discuss the effects of different device topologies on SET sensitivity. Our results agree qualitatively with SPICE model calculations of LM139s by Johnston et al.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2002.805414