Single-wafer integrated semiconductor device processing
The authors present an overview of various single-wafer fabrication techniques for integrated processing of microelectronic devices. Numerous processing modules, sensors, and associated fabrication processes have been developed for advanced semiconductor device manufacturing. The combination of sing...
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Veröffentlicht in: | IEEE transactions on electron devices 1992-01, Vol.39 (1), p.4-32 |
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Hauptverfasser: | , , , , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The authors present an overview of various single-wafer fabrication techniques for integrated processing of microelectronic devices. Numerous processing modules, sensors, and associated fabrication processes have been developed for advanced semiconductor device manufacturing. The combination of single-wafer processing, cluster tools, sensors, and advanced factory control/computer-integrated manufacturing techniques provides a capability for flexible fast-cycle-time device manufacturing. Specific developments and results are described in the areas of dry/vapor-phase surface cleaning, epitaxy, plasma processing, rapid thermal processing, and in situ sensors. An integrated sub-half micrometer CMOS technology based on these single-wafer fabrication methods including rapid thermal processing is also described.< > |
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ISSN: | 0018-9383 1557-9646 |
DOI: | 10.1109/16.108208 |