Single-wafer integrated semiconductor device processing

The authors present an overview of various single-wafer fabrication techniques for integrated processing of microelectronic devices. Numerous processing modules, sensors, and associated fabrication processes have been developed for advanced semiconductor device manufacturing. The combination of sing...

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Veröffentlicht in:IEEE transactions on electron devices 1992-01, Vol.39 (1), p.4-32
Hauptverfasser: Moslehi, M.M., Chapman, R.A., Wong, M., Paranjpe, A., Najm, H.N., Kuehne, J., Yeakley, R.L., Davis, C.J.
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Sprache:eng
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Zusammenfassung:The authors present an overview of various single-wafer fabrication techniques for integrated processing of microelectronic devices. Numerous processing modules, sensors, and associated fabrication processes have been developed for advanced semiconductor device manufacturing. The combination of single-wafer processing, cluster tools, sensors, and advanced factory control/computer-integrated manufacturing techniques provides a capability for flexible fast-cycle-time device manufacturing. Specific developments and results are described in the areas of dry/vapor-phase surface cleaning, epitaxy, plasma processing, rapid thermal processing, and in situ sensors. An integrated sub-half micrometer CMOS technology based on these single-wafer fabrication methods including rapid thermal processing is also described.< >
ISSN:0018-9383
1557-9646
DOI:10.1109/16.108208