Built-in test for complex digital integrated circuits

Built-in test for complex digital integrated circuits

A method for testing the logic function of complex digital integrated circuits is presented. The extra hardware needed is kept minimal by functional conversion of already existing components (e.g., registers). The feasibility of the proposed method is demonstrated by results from both hardware simul...

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Veröffentlicht in:IEEE journal of solid-state circuits 1980-06, Vol.15 (3), p.315-319
Hauptverfasser: Konemann, B., Zwiehoff, G., Mucha, J.
Format: Artikel
Sprache:eng
Schlagworte:
Built-in self-test
Circuit analysis
Circuit simulation
Circuit testing
Digital integrated circuits
Hardware
Integrated circuit testing
Logic functions
Logic testing
Registers
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Beschreibung
Zusammenfassung:A method for testing the logic function of complex digital integrated circuits is presented. The extra hardware needed is kept minimal by functional conversion of already existing components (e.g., registers). The feasibility of the proposed method is demonstrated by results from both hardware simulation and logic simulation. The method is based on an adapted version of signature analysis, and on circuit partitioning (the structure of VLSI circuits is assumed to be inherently modular).
ISSN:0018-9200
1558-173X
DOI:10.1109/JSSC.1980.1051391