Critical density effects in sub-picosecond laser-ablation of silicon by plasma-absorption ion-energy spectroscopy
Summary from only given. It is shown in this work that the critical density condition of a plasma initially formed by a single pulse can be subsequently modified by the pumping action of a secondary time-delayed pulse. We show the results of measuring total ion yield and average energy in a pre-form...
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| container_end_page | 135 vol.1 |
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| container_start_page | 134 |
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| creator | Zhang, Z. VanRompay, P.A. Yalisove, S.M. Mourou, G.A. Pronko, P.P. |
| description | Summary from only given. It is shown in this work that the critical density condition of a plasma initially formed by a single pulse can be subsequently modified by the pumping action of a secondary time-delayed pulse. We show the results of measuring total ion yield and average energy in a pre-formed ablation plume generated by a 120 femtosecond (780 nm) laser pulse followed by an identical time delayed pulse. |
| doi_str_mv | 10.1109/CLEO.2002.1033527 |
| format | Conference Proceeding |
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It is shown in this work that the critical density condition of a plasma initially formed by a single pulse can be subsequently modified by the pumping action of a secondary time-delayed pulse. We show the results of measuring total ion yield and average energy in a pre-formed ablation plume generated by a 120 femtosecond (780 nm) laser pulse followed by an identical time delayed pulse.</description><identifier>ISBN: 9781557527066</identifier><identifier>ISBN: 1557527067</identifier><identifier>DOI: 10.1109/CLEO.2002.1033527</identifier><language>eng</language><publisher>IEEE</publisher><subject>Energy measurement ; Laser ablation ; Optical pulse generation ; Plasma density ; Plasma measurements ; Pulse measurements ; Pump lasers ; Silicon ; Spectroscopy ; Time measurement</subject><ispartof>Summaries of Papers Presented at the Lasers and Electro-Optics. CLEO '02. 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We show the results of measuring total ion yield and average energy in a pre-formed ablation plume generated by a 120 femtosecond (780 nm) laser pulse followed by an identical time delayed pulse.</description><subject>Energy measurement</subject><subject>Laser ablation</subject><subject>Optical pulse generation</subject><subject>Plasma density</subject><subject>Plasma measurements</subject><subject>Pulse measurements</subject><subject>Pump lasers</subject><subject>Silicon</subject><subject>Spectroscopy</subject><subject>Time measurement</subject><isbn>9781557527066</isbn><isbn>1557527067</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2002</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><sourceid>RIE</sourceid><recordid>eNp9z89qwzAMBnDDGHSseYDSi14gmZ2_yzl07DDYpffiuEpRcW3Xyg5--5nR8wTiQ_zgAwmxU7JSSo5v09fhu6qlrCslm6arhydRjMO76rohH7LvN6Jgvso8bdv0Y_si7lOklYy2cEbHtCbAZUGzMpAD_pnLQMYzGu_OYDVjLPVs9UregV-AyWZ2MCcIWW86K_sY_jxviQ7jJQGHXBk9Gx_SVjwv2jIWj3wV-4_DcfosCRFPIdJNx3R6PND8r7-uNkyp</recordid><startdate>2002</startdate><enddate>2002</enddate><creator>Zhang, Z.</creator><creator>VanRompay, P.A.</creator><creator>Yalisove, S.M.</creator><creator>Mourou, G.A.</creator><creator>Pronko, P.P.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>2002</creationdate><title>Critical density effects in sub-picosecond laser-ablation of silicon by plasma-absorption ion-energy spectroscopy</title><author>Zhang, Z. ; VanRompay, P.A. ; Yalisove, S.M. ; Mourou, G.A. ; Pronko, P.P.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-ieee_primary_10335273</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2002</creationdate><topic>Energy measurement</topic><topic>Laser ablation</topic><topic>Optical pulse generation</topic><topic>Plasma density</topic><topic>Plasma measurements</topic><topic>Pulse measurements</topic><topic>Pump lasers</topic><topic>Silicon</topic><topic>Spectroscopy</topic><topic>Time measurement</topic><toplevel>online_resources</toplevel><creatorcontrib>Zhang, Z.</creatorcontrib><creatorcontrib>VanRompay, P.A.</creatorcontrib><creatorcontrib>Yalisove, S.M.</creatorcontrib><creatorcontrib>Mourou, G.A.</creatorcontrib><creatorcontrib>Pronko, P.P.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Zhang, Z.</au><au>VanRompay, P.A.</au><au>Yalisove, S.M.</au><au>Mourou, G.A.</au><au>Pronko, P.P.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Critical density effects in sub-picosecond laser-ablation of silicon by plasma-absorption ion-energy spectroscopy</atitle><btitle>Summaries of Papers Presented at the Lasers and Electro-Optics. CLEO '02. Technical Diges</btitle><stitle>CLEO</stitle><date>2002</date><risdate>2002</risdate><spage>134</spage><epage>135 vol.1</epage><pages>134-135 vol.1</pages><isbn>9781557527066</isbn><isbn>1557527067</isbn><abstract>Summary from only given. It is shown in this work that the critical density condition of a plasma initially formed by a single pulse can be subsequently modified by the pumping action of a secondary time-delayed pulse. We show the results of measuring total ion yield and average energy in a pre-formed ablation plume generated by a 120 femtosecond (780 nm) laser pulse followed by an identical time delayed pulse.</abstract><pub>IEEE</pub><doi>10.1109/CLEO.2002.1033527</doi></addata></record> |
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| identifier | ISBN: 9781557527066 |
| ispartof | Summaries of Papers Presented at the Lasers and Electro-Optics. CLEO '02. Technical Diges, 2002, p.134-135 vol.1 |
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| language | eng |
| recordid | cdi_ieee_primary_1033527 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Energy measurement Laser ablation Optical pulse generation Plasma density Plasma measurements Pulse measurements Pump lasers Silicon Spectroscopy Time measurement |
| title | Critical density effects in sub-picosecond laser-ablation of silicon by plasma-absorption ion-energy spectroscopy |
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