On test data volume reduction for multiple scan chain designs

On test data volume reduction for multiple scan chain designs

We consider issues related to the reduction of scan test data in designs with multiple scan chains. We propose a metric that can be used to evaluate the effectiveness of procedures for reducing the scan data volume. The metric compares the achieved compression to the compression which is intrinsic t...

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Bibliographische Detailangaben
Hauptverfasser: Reddy, S.M., Miyase, K., Kajihara, S., Pomeranz, I.
Format: Tagungsbericht
Sprache:eng
Schlagworte:
Circuit faults
Circuit testing
Costs
Data engineering
Design engineering
Electronic equipment testing
Encoding
Microelectronics
System testing
Very large scale integration
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Beschreibung
Zusammenfassung:We consider issues related to the reduction of scan test data in designs with multiple scan chains. We propose a metric that can be used to evaluate the effectiveness of procedures for reducing the scan data volume. The metric compares the achieved compression to the compression which is intrinsic to the use of multiple scan chains. We also propose a procedure for modifying a given test set so as to achieve reductions in test data volume assuming a combinational decompressor circuit.
DOI:10.1109/VTS.2002.1011119