Measurement of refraction index of thick and nontransparent isotropic material using transmission microwave ellipsometry

Measurement of refraction index of thick and nontransparent isotropic material using transmission microwave ellipsometry

ABSTRACT This article introduces an original microwave ellipsometry method for the characterization of dielectric materials. It is a nondestructive technique based on the interaction between wave and material in the 26–40 GHz frequency range. The refraction index is obtained by measuring the rotatio...

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Veröffentlicht in:Microwave and optical technology letters 2015-04, Vol.57 (4), p.1006-1013
Hauptverfasser: Moungache, A., Bayard, B., Tahir, Abakar Mahamat, Robert, S., Jamon, D., Gambou, F.
Format: Artikel
Sprache:eng
Schlagworte:
Angular position
characterization
Dielectrics
Electromagnetism
Ellipsometry
Engineering Sciences
Frequency ranges
isotropy
Microwaves
Polarization
Polytetrafluoroethylenes
Refracted waves
Refraction
refraction index
transmission
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Zusammenfassung:ABSTRACT This article introduces an original microwave ellipsometry method for the characterization of dielectric materials. It is a nondestructive technique based on the interaction between wave and material in the 26–40 GHz frequency range. The refraction index is obtained by measuring the rotation angle of the refracted wave polarization for different angular positions of the sample. The technique is then validated with polytetrafluoroethylene samples which refraction index is known. © 2015 Wiley Periodicals, Inc. Microwave Opt Technol Lett 57:1006–1013, 2015
ISSN:0895-2477
1098-2760
DOI:10.1002/mop.28998