Independent component analysis: A new possibility for analysing series of electron energy loss spectra
A complementary approach is proposed for analysing series of electron energy-loss spectra that can be recorded with the spectrum-line technique, across an interface for instance. This approach, called blind source separation (BSS) or independent component analysis (ICA), complements two existing met...
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Veröffentlicht in: | Ultramicroscopy 2005-03, Vol.102 (4), p.327-337 |
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Hauptverfasser: | , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | A complementary approach is proposed for analysing series of electron energy-loss spectra that can be recorded with the spectrum-line technique, across an interface for instance. This approach, called blind source separation (BSS) or independent component analysis (ICA), complements two existing methods: the spatial difference approach and multivariate statistical analysis. The principle of the technique is presented and illustrations are given through one simulated example and one real example. |
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ISSN: | 0304-3991 1879-2723 |
DOI: | 10.1016/j.ultramic.2004.11.003 |