Independent component analysis: A new possibility for analysing series of electron energy loss spectra

A complementary approach is proposed for analysing series of electron energy-loss spectra that can be recorded with the spectrum-line technique, across an interface for instance. This approach, called blind source separation (BSS) or independent component analysis (ICA), complements two existing met...

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Veröffentlicht in:Ultramicroscopy 2005-03, Vol.102 (4), p.327-337
Hauptverfasser: Bonnet, Noël, Nuzillard, Danielle
Format: Artikel
Sprache:eng
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Zusammenfassung:A complementary approach is proposed for analysing series of electron energy-loss spectra that can be recorded with the spectrum-line technique, across an interface for instance. This approach, called blind source separation (BSS) or independent component analysis (ICA), complements two existing methods: the spatial difference approach and multivariate statistical analysis. The principle of the technique is presented and illustrations are given through one simulated example and one real example.
ISSN:0304-3991
1879-2723
DOI:10.1016/j.ultramic.2004.11.003