Domain Wall Architecture in Tetragonal Ferroelectric Thin Films

Domain Wall Architecture in Tetragonal Ferroelectric Thin Films

Non‐Ising‐like 180° ferroelectric domain wall architecture and domain distribution in tetragonal PbZrxTi1−xO3 thin films are probed using a combination of optical second harmonic generation and scanning transmission electron microscopy. In the remnant state, a specific nonlinear optical signature of...

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Veröffentlicht in:Advanced materials (Weinheim) 2017-02, Vol.29 (7), p.np-n/a
Hauptverfasser: De Luca, Gabriele, Rossell, Marta D., Schaab, Jakob, Viart, Nathalie, Fiebig, Manfred, Trassin, Morgan
Format: Artikel
Sprache:eng
Schlagworte:
Architecture
Chemical Sciences
Domain walls
ferroelectric domain wall
Ferroelectric domains
Ferroelectric materials
Ising model
Ising–Néel wall
Materials science
Polarization
PZT thin films
Scanning electron microscopy
Scanning transmission electron microscopy
Second harmonic generation
Signatures
Thin films
Transmission electron microscopy
Walls
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Beschreibung
Zusammenfassung:Non‐Ising‐like 180° ferroelectric domain wall architecture and domain distribution in tetragonal PbZrxTi1−xO3 thin films are probed using a combination of optical second harmonic generation and scanning transmission electron microscopy. In the remnant state, a specific nonlinear optical signature of tilted 180° domain walls corresponding to a mixed Ising–Néel‐type rotation of polarization across the wall is shown.
ISSN:0935-9648
1521-4095
DOI:10.1002/adma.201605145