Deep-Level Structure of the Spin-Active Recombination Center in Dilute Nitrides

A gallium interstitial defect is thought to be responsible for the spectacular spin-dependent recombination in GaAs_{1-x}N_{x} dilute nitrides. Current understanding associates this defect with at least two in-gap levels corresponding to the (+/0) and (++/+) charge-state transitions. Using a spin-se...

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Veröffentlicht in:Physical review letters 2024-05, Vol.132 (18), p.186402-186402, Article 186402
Hauptverfasser: Ulibarri, A C, Lew, C T K, Lim, S Q, McCallum, J C, Johnson, B C, Harmand, J C, Peretti, J, Rowe, A C H
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Sprache:eng
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Zusammenfassung:A gallium interstitial defect is thought to be responsible for the spectacular spin-dependent recombination in GaAs_{1-x}N_{x} dilute nitrides. Current understanding associates this defect with at least two in-gap levels corresponding to the (+/0) and (++/+) charge-state transitions. Using a spin-sensitive photoinduced current transient spectroscopy, the in-gap electronic structure of a x=0.021 alloy is revealed. The (+/0) state lies ≈0.27  eV below the conduction band edge, and an anomalous, negative activation energy reveals the presence of not one but two other in-gap states. The observations are consistent with a (++/+) state ≈0.19  eV above the valence band edge, and a (+++/++) state ≈25  meV above the valence band edge.
ISSN:0031-9007
1079-7114
DOI:10.1103/PhysRevLett.132.186402