In situ studies of electrochemical interfaces by grazing angle X-ray reflection

Measurements of the angular dependence of x‐ray reflectivity from liquid Hg and Ga ranging up to several times the value of the critical angle can yield information about the mean electron density profile on the metal side of an electrochemical interface. As in the metal/vapor interface, our results suggest that the liquid metal/electrolyte interface is stratified for a few atomic layers when the metal is polarized at the zero charge potential.