Engineering and detection of light scattering directionalities in dewetted nanoresonators through dark-field scanning microscopy

Dewetted, SiGe nanoparticles have been successfully exploited for light management in the visible and near-infrared, although their scattering properties have been so far only qualitatively studied. Here, we demonstrate that the Mie resonances sustained by a SiGe-based nanoantenna under tilted illumination, can generate radiation patterns in different directions. We introduce a novel dark-field microscopy setup that exploits the movement of the nanoantenna under the objective lens to spectrally isolate Mie resonances contribution to the total scattering cross-section during the same measurement. The knowledge of islands' aspect ratio is then benchmarked by 3D, anisotropic phase-field simulations and contributes to a correct interpretation of the experimental data.