Highly efficient lead-free silver bismuth iodide (Ag3BiI6) rudorffite solar cells with novel device architecture: A numerical study
Solar cells (SCs) based on non-toxic, lead-free silver bismuth iodide (SBI, Ag3BiI6) absorbers have recently gained tremendous attention compared to lead halide perovskites. However, the actual device efficiency still does not exceed 6%. Therefore, finding a suitable SBI SC architecture with proper...
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Veröffentlicht in: | Materials today communications 2024-03, Vol.38, p.108347, Article 108347 |
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Zusammenfassung: | Solar cells (SCs) based on non-toxic, lead-free silver bismuth iodide (SBI, Ag3BiI6) absorbers have recently gained tremendous attention compared to lead halide perovskites. However, the actual device efficiency still does not exceed 6%. Therefore, finding a suitable SBI SC architecture with proper ETL and HTL layers is crucial to attaining maximum performance. In this research, the SCAPS-1D simulation is used to design the SC, consisting of an SBI-absorber, CeOx-ETL, and three different HTLs (pristine Cu2O, Te & Se/Te doped Cu2O) under the standard illumination. After optimization of all layers thickness and defect densities, the Se/Te-Cu2O-HTL device showed a maximum efficiency of 17.7% with a higher built-in potential (1.37 V) than other HTL devices (16.5%, 1.31 V for Te-Cu2O & 16%, 1.25 V for Cu2O) due to its enhanced hole transfer and reduced recombination at the Ag3BiI6/HTL interface. Besides, the impact of radiative recombinations, parasitic resistances, capacitance, Mott-Schottky, Nyquist plot and working temperature are carefully examined. The Voc deficit increases by increasing the operating temperature, and visibly, Se/Te-Cu2O (0.49 V) shows a higher Voc deficit than Te-Cu2O (0.39 V) and Cu2O (0.34 V) HTL devices. Overall, our findings can be helpful to experimentalists to reach high efficiency in the near future.
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•FTO/CeOx/Ag3BiI6/HTLs (i.e., Cu2O, Te-Cu2O, and Se/Te-Cu2O)/Au device structure was simulated using drift-diffusion SCAPS-1D simulation.•A slight variation in the Nt dramatically reduces the charge carriers' lifetime and diffusion length, leading to surface/interface recombinations.•Se/Te-Cu2O-HTL device (0.49 V) shows a higher Voc deficit than Te-Cu2O (0.39 V) and Cu2O (0.34 V) HTL devices.•The Se/Te-Cu2O-HTL device delivers an efficient charge separation driving force and reduced recombinations compared to other HTLs.•As a result, the Se/Te-Cu2O HTL device offers a maximum PCE (17.77%) than Cu2O (15.98%) and Te-Cu2O (16.66%) devices. |
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ISSN: | 2352-4928 2352-4928 |
DOI: | 10.1016/j.mtcomm.2024.108347 |