CdHgTe Bragg reflectors grown by molecular beam epitaxy

CdHgTe Bragg reflectors grown by molecular beam epitaxy

High-reflectivity CdTe/CdHgTe epitaxial mirrors were grown by molecular beam epitaxy (MBE). They exhibited 95% or more reflectivity in their stopband regions around 2 or 2.5 μm wavelength. The uniformity of the growth is excellent, with the thickness standard deviation better than 3%, as measured wi...

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Veröffentlicht in:Journal of crystal growth 1993-02, Vol.127 (1), p.375-378
Hauptverfasser: Bleuse, J., Magnea, N., Jouneau, P.H., Mariette, H.
Format: Artikel
Sprache:eng
Schlagworte:
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties
Physics
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
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Zusammenfassung:High-reflectivity CdTe/CdHgTe epitaxial mirrors were grown by molecular beam epitaxy (MBE). They exhibited 95% or more reflectivity in their stopband regions around 2 or 2.5 μm wavelength. The uniformity of the growth is excellent, with the thickness standard deviation better than 3%, as measured with high resolution transmission electron microscopy (HRTEM).
ISSN:0022-0248
1873-5002
DOI:10.1016/0022-0248(93)90642-A