Measurement and Simulation of Mechanical and Optical Properties of Sputtered Amorphous SiC Coatings

In this work we report on the extensive characterization of amorphous silicon carbide ( a -SiC) coatings prepared by physical deposition methods. Our investigation is performed within the perspective application of a -SiC as an optical material for high-precision optical experiments and, in particul...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Physical review applied 2022-10, Vol.18 (4), Article 044030
Hauptverfasser: Favaro, G., Bazzan, M., Amato, A., Arciprete, F., Cesarini, E., Corso, A.J., De Matteis, F., Dao, T.H., Granata, M., Honrado-Benítez, C., Gutiérrez-Luna, N., Larruquert, J.I., Lorenzin, G., Lumaca, D., Maggioni, G., Magnozzi, M., Pelizzo, M.G., Placidi, E., Prosposito, P., Puosi, F.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:In this work we report on the extensive characterization of amorphous silicon carbide ( a -SiC) coatings prepared by physical deposition methods. Our investigation is performed within the perspective application of a -SiC as an optical material for high-precision optical experiments and, in particular, in gravitational wave interferometry. We compare the results obtained with two different sputtering systems [a standard radio frequency (rf) magnetron sputtering and an ion-beam sputtering] to grasp the impact of two different setups on the repeatability of the results. After a thorough characterization of structural, morphological, and compositional characteristics of the prepared samples, we focus on a detailed study of the optical and mechanical losses in those materials. Mechanical losses are further investigated from a microscopic point of view by comparing our experimental results with molecular dynamic simulations of the amorphous SiC structure: first we define a protocol to generate a numerical model of the amorphous film, capturing the main features of the real system; then we simulate its dynamical behavior upon deformation in order to obtain its mechanical response.
ISSN:2331-7019
2331-7019
DOI:10.1103/PhysRevApplied.18.044030