Measurement error due to self-absorption in calibration-free laser-induced breakdown spectroscopy

Self-absorption of spectral lines is known to lower the performance of analytical measurements via calibration-free laser-induced breakdown spectroscopy. However, the error growth due to this effect is not clearly assessed. Here we propose a method to quantify the measurement error due to self-absor...

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Veröffentlicht in:Analytica chimica acta 2021-11, Vol.1185, p.339070-339070, Article 339070
Hauptverfasser: Taleb, Aya, Motto-Ros, Vincent, Carru, Mauro J., Axente, Emanuel, Craciun, Valentin, Pelascini, Frédéric, Hermann, Jörg
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Sprache:eng
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Zusammenfassung:Self-absorption of spectral lines is known to lower the performance of analytical measurements via calibration-free laser-induced breakdown spectroscopy. However, the error growth due to this effect is not clearly assessed. Here we propose a method to quantify the measurement error due to self-absorption based on the calculation of the spectral radiance of a plasma in local thermodynamic equilibrium. Validated through spectroscopic measurements for a binary alloy thin film of compositional gradient, the method evidences that measurement performance lowering due to self-absorption depends on the spectral shape of the analytical transition and on the intensity measurement method. Thus, line-integrated intensity measurements of Stark broadened lines enable accurate analysis, even at large optical thickness, if line width and plasma size are precisely known. The error growth due to self-absorption is significantly larger for line shapes dominated by Doppler broadening and for line-center intensity measurements. The findings present a significant advance in compositional measurements via calibration-free laser-induced breakdown spectroscopy, as they enable straightforward selection of most appropriate analytical lines. [Display omitted] •Evaluation of measurement error due to self-absorption in calibration-free laserinduced breakdown spectroscopy.•Rigorous error calculation including all significant error sources.•Illustration of error dependence on spectral line profile.•Accurate simulation of emission spectra of laser-induced plasma.
ISSN:0003-2670
1873-4324
DOI:10.1016/j.aca.2021.339070