Analog and mixed-signal circuits simulation for product level EMMI analysis

The goal of this work is to propose a new flow that integrates the analog and mixed signal simulation of the circuits to replicate the EMMI signals. This supports the fault localization process. We explore the emission typologies of the transistors, focusing the attention on the DMOS structure. First experimental results show the benefits of this approach. •The creation of a software that can simulate the light emission in near IR range of analog and mixed-signal circuits.•Light emission simulation speeds up the fault isolation step, avoiding the image comparison between golden and faulty unit.•The emission simulation tool validates hypotheses of physical defect, increasing the success rate and accuracy of analysis.