Formation of interstitial silicon defects in Si- and Si,P-doped nanodiamonds and thermal susceptibilities of SiV - photoluminescence band
We have produced two types of synthetic nanodiamonds Si- and Si,P-doped and have characterized the thermal susceptibilities of the spectral band of silicon-vacancy (SiV ) centers at approximately 740 nm in each case. The covered temperature range from 295 to 350 K is of interest for thermometry in b...
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Veröffentlicht in: | Nanotechnology 2020-05, Vol.31 (20), p.205709-205709 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | We have produced two types of synthetic nanodiamonds Si- and Si,P-doped and have characterized the thermal susceptibilities of the spectral band of silicon-vacancy (SiV
) centers at approximately 740 nm in each case. The covered temperature range from 295 to 350 K is of interest for thermometry in biological systems. Comparison of the relative brightness of the Si- and Si,P-doped crystals shows that phosphorous significantly increases average concentration and homogeneity of distribution of SiV
centers in nanodiamonds. Moreover, linear dependence on temperature of the zero-phonon line width in Si-doped crystals is 0.061(2) nm K
but is 0.047(3) nm K
, about 35% smaller in Si,P-doped nanodiamonds. This proves control of SiV
properties with additional chemical doping and close proximity of Si and P atoms. |
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ISSN: | 0957-4484 1361-6528 |
DOI: | 10.1088/1361-6528/ab72bb |