Formation of interstitial silicon defects in Si- and Si,P-doped nanodiamonds and thermal susceptibilities of SiV - photoluminescence band

We have produced two types of synthetic nanodiamonds Si- and Si,P-doped and have characterized the thermal susceptibilities of the spectral band of silicon-vacancy (SiV ) centers at approximately 740 nm in each case. The covered temperature range from 295 to 350 K is of interest for thermometry in b...

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Veröffentlicht in:Nanotechnology 2020-05, Vol.31 (20), p.205709-205709
Hauptverfasser: Choi, Sumin, Agafonov, Viatcheslav N, Davydov, Valery A, Kulikova, Ludmila F, Plakhotnik, Taras
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Sprache:eng
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Zusammenfassung:We have produced two types of synthetic nanodiamonds Si- and Si,P-doped and have characterized the thermal susceptibilities of the spectral band of silicon-vacancy (SiV ) centers at approximately 740 nm in each case. The covered temperature range from 295 to 350 K is of interest for thermometry in biological systems. Comparison of the relative brightness of the Si- and Si,P-doped crystals shows that phosphorous significantly increases average concentration and homogeneity of distribution of SiV centers in nanodiamonds. Moreover, linear dependence on temperature of the zero-phonon line width in Si-doped crystals is 0.061(2) nm K but is 0.047(3) nm K , about 35% smaller in Si,P-doped nanodiamonds. This proves control of SiV properties with additional chemical doping and close proximity of Si and P atoms.
ISSN:0957-4484
1361-6528
DOI:10.1088/1361-6528/ab72bb