Methods for Gibbs triple junction excess determination: Ti segregation in CoSi2 thin film

Methods are presented determining the Gibbs triple junction excess ( Γ TJ ) of solute segregation in polycrystalline materials from single atom counting in 3D volumes. One method bases on cumulative profile analysis, while two further methods use radial integration of solute atoms. The methods are d...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	Journal of materials science 2020-09, Vol.55 (27), p.13177-13192
Hauptverfasser:	Zschiesche, Hannes, Charai, Ahmed, Alfonso, Claude, Mangelinck, Dominique
Format:	Artikel
Sprache:	eng
Schlagworte:	Boundaries Characterization and Evaluation of Materials Chemical Sciences Chemistry and Materials Science Classical Mechanics Cobalt silicide Computer simulation Crystallography and Scattering Methods Crystals Grain boundaries Magma Material chemistry Materials Science Polymer Sciences Solid Mechanics Spatial resolution Thin films Tomography
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Schreiben Sie den ersten Kommentar!