Exploring the feasibility of selective hardening for combinational logic

In this work we introduce a cost-aware methodology for selective hardening of combinational logic cells, which provides a list of the most effective candidates for hardening. Two heuristics are proposed in order to define when selective hardening becomes unfeasible. The methodology and the heuristic...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Microelectronics and reliability 2012-09, Vol.52 (9-10), p.1843-1847
Hauptverfasser: Pagliarini, S.N., dos Santos, G.G., de B. Naviner, L.A., Naviner, J.-F.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 1847
container_issue 9-10
container_start_page 1843
container_title Microelectronics and reliability
container_volume 52
creator Pagliarini, S.N.
dos Santos, G.G.
de B. Naviner, L.A.
Naviner, J.-F.
description In this work we introduce a cost-aware methodology for selective hardening of combinational logic cells, which provides a list of the most effective candidates for hardening. Two heuristics are proposed in order to define when selective hardening becomes unfeasible. The methodology and the heuristics are applied to a set of benchmark circuits using costs extracted from an actual standard cell library. The results then show that both heuristics might be appropriate for different scenarios.
doi_str_mv 10.1016/j.microrel.2012.06.042
format Article
fullrecord <record><control><sourceid>hal_cross</sourceid><recordid>TN_cdi_hal_primary_oai_HAL_hal_02942480v1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0026271412002399</els_id><sourcerecordid>oai_HAL_hal_02942480v1</sourcerecordid><originalsourceid>FETCH-LOGICAL-c376t-967028c1dfbb02d600c63e32fadd8d56de27b6178c36525efd3e168f65d31be53</originalsourceid><addsrcrecordid>eNqFkEFLwzAUgIMoOKd_QXrx4KH1JW3T7uYY0wkDLwreQpq8bBlZM5Iy3L-3pbqrp8Dj-94jHyH3FDIKlD_tsr1VwQd0GQPKMuAZFOyCTGhdsXRW0K9LMgFgPGUVLa7JTYw7AKiA0glZLb8PzgfbbpJui4lBGW1jne1OiTdJRIeqs0dMtjJobAfM-JAov29sKzvrW-kS5zdW3ZIrI13Eu993Sj5flh-LVbp-f31bzNepyivepTNeAasV1aZpgGkOoHiOOTNS61qXXCOrGk6rWuW8ZCUanSPlteGlzmmDZT4lj-PerXTiEOxehpPw0orVfC2GGbBZwYoajrRn-cj2eWIMaM4CBTG0Ezvx104M7QRw0bfrxYdRPMiopDNBtsrGs814WdQMip57Hjnsf3y0GERUFluF2oY-nNDe_nfqBwt3iK0</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Exploring the feasibility of selective hardening for combinational logic</title><source>Access via ScienceDirect (Elsevier)</source><creator>Pagliarini, S.N. ; dos Santos, G.G. ; de B. Naviner, L.A. ; Naviner, J.-F.</creator><creatorcontrib>Pagliarini, S.N. ; dos Santos, G.G. ; de B. Naviner, L.A. ; Naviner, J.-F.</creatorcontrib><description>In this work we introduce a cost-aware methodology for selective hardening of combinational logic cells, which provides a list of the most effective candidates for hardening. Two heuristics are proposed in order to define when selective hardening becomes unfeasible. The methodology and the heuristics are applied to a set of benchmark circuits using costs extracted from an actual standard cell library. The results then show that both heuristics might be appropriate for different scenarios.</description><identifier>ISSN: 0026-2714</identifier><identifier>EISSN: 1872-941X</identifier><identifier>DOI: 10.1016/j.microrel.2012.06.042</identifier><identifier>CODEN: MCRLAS</identifier><language>eng</language><publisher>Kidlington: Elsevier Ltd</publisher><subject>Applied sciences ; Circuit properties ; Computer Science ; Design. Technologies. Operation analysis. Testing ; Digital circuits ; Electric, optical and optoelectronic circuits ; Electronic circuits ; Electronics ; Exact sciences and technology ; Hardware Architecture ; Integrated circuits ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><ispartof>Microelectronics and reliability, 2012-09, Vol.52 (9-10), p.1843-1847</ispartof><rights>2012 Elsevier Ltd</rights><rights>2015 INIST-CNRS</rights><rights>Distributed under a Creative Commons Attribution 4.0 International License</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c376t-967028c1dfbb02d600c63e32fadd8d56de27b6178c36525efd3e168f65d31be53</citedby><cites>FETCH-LOGICAL-c376t-967028c1dfbb02d600c63e32fadd8d56de27b6178c36525efd3e168f65d31be53</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.microrel.2012.06.042$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>230,310,311,315,782,786,791,792,887,3552,23937,23938,25147,27931,27932,46002</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=26548204$$DView record in Pascal Francis$$Hfree_for_read</backlink><backlink>$$Uhttps://hal.science/hal-02942480$$DView record in HAL$$Hfree_for_read</backlink></links><search><creatorcontrib>Pagliarini, S.N.</creatorcontrib><creatorcontrib>dos Santos, G.G.</creatorcontrib><creatorcontrib>de B. Naviner, L.A.</creatorcontrib><creatorcontrib>Naviner, J.-F.</creatorcontrib><title>Exploring the feasibility of selective hardening for combinational logic</title><title>Microelectronics and reliability</title><description>In this work we introduce a cost-aware methodology for selective hardening of combinational logic cells, which provides a list of the most effective candidates for hardening. Two heuristics are proposed in order to define when selective hardening becomes unfeasible. The methodology and the heuristics are applied to a set of benchmark circuits using costs extracted from an actual standard cell library. The results then show that both heuristics might be appropriate for different scenarios.</description><subject>Applied sciences</subject><subject>Circuit properties</subject><subject>Computer Science</subject><subject>Design. Technologies. Operation analysis. Testing</subject><subject>Digital circuits</subject><subject>Electric, optical and optoelectronic circuits</subject><subject>Electronic circuits</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Hardware Architecture</subject><subject>Integrated circuits</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><issn>0026-2714</issn><issn>1872-941X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><recordid>eNqFkEFLwzAUgIMoOKd_QXrx4KH1JW3T7uYY0wkDLwreQpq8bBlZM5Iy3L-3pbqrp8Dj-94jHyH3FDIKlD_tsr1VwQd0GQPKMuAZFOyCTGhdsXRW0K9LMgFgPGUVLa7JTYw7AKiA0glZLb8PzgfbbpJui4lBGW1jne1OiTdJRIeqs0dMtjJobAfM-JAov29sKzvrW-kS5zdW3ZIrI13Eu993Sj5flh-LVbp-f31bzNepyivepTNeAasV1aZpgGkOoHiOOTNS61qXXCOrGk6rWuW8ZCUanSPlteGlzmmDZT4lj-PerXTiEOxehpPw0orVfC2GGbBZwYoajrRn-cj2eWIMaM4CBTG0Ezvx104M7QRw0bfrxYdRPMiopDNBtsrGs814WdQMip57Hjnsf3y0GERUFluF2oY-nNDe_nfqBwt3iK0</recordid><startdate>20120901</startdate><enddate>20120901</enddate><creator>Pagliarini, S.N.</creator><creator>dos Santos, G.G.</creator><creator>de B. Naviner, L.A.</creator><creator>Naviner, J.-F.</creator><general>Elsevier Ltd</general><general>Elsevier</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>1XC</scope></search><sort><creationdate>20120901</creationdate><title>Exploring the feasibility of selective hardening for combinational logic</title><author>Pagliarini, S.N. ; dos Santos, G.G. ; de B. Naviner, L.A. ; Naviner, J.-F.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c376t-967028c1dfbb02d600c63e32fadd8d56de27b6178c36525efd3e168f65d31be53</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Applied sciences</topic><topic>Circuit properties</topic><topic>Computer Science</topic><topic>Design. Technologies. Operation analysis. Testing</topic><topic>Digital circuits</topic><topic>Electric, optical and optoelectronic circuits</topic><topic>Electronic circuits</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Hardware Architecture</topic><topic>Integrated circuits</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Pagliarini, S.N.</creatorcontrib><creatorcontrib>dos Santos, G.G.</creatorcontrib><creatorcontrib>de B. Naviner, L.A.</creatorcontrib><creatorcontrib>Naviner, J.-F.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Hyper Article en Ligne (HAL)</collection><jtitle>Microelectronics and reliability</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Pagliarini, S.N.</au><au>dos Santos, G.G.</au><au>de B. Naviner, L.A.</au><au>Naviner, J.-F.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Exploring the feasibility of selective hardening for combinational logic</atitle><jtitle>Microelectronics and reliability</jtitle><date>2012-09-01</date><risdate>2012</risdate><volume>52</volume><issue>9-10</issue><spage>1843</spage><epage>1847</epage><pages>1843-1847</pages><issn>0026-2714</issn><eissn>1872-941X</eissn><coden>MCRLAS</coden><abstract>In this work we introduce a cost-aware methodology for selective hardening of combinational logic cells, which provides a list of the most effective candidates for hardening. Two heuristics are proposed in order to define when selective hardening becomes unfeasible. The methodology and the heuristics are applied to a set of benchmark circuits using costs extracted from an actual standard cell library. The results then show that both heuristics might be appropriate for different scenarios.</abstract><cop>Kidlington</cop><pub>Elsevier Ltd</pub><doi>10.1016/j.microrel.2012.06.042</doi><tpages>5</tpages></addata></record>
fulltext fulltext
identifier ISSN: 0026-2714
ispartof Microelectronics and reliability, 2012-09, Vol.52 (9-10), p.1843-1847
issn 0026-2714
1872-941X
language eng
recordid cdi_hal_primary_oai_HAL_hal_02942480v1
source Access via ScienceDirect (Elsevier)
subjects Applied sciences
Circuit properties
Computer Science
Design. Technologies. Operation analysis. Testing
Digital circuits
Electric, optical and optoelectronic circuits
Electronic circuits
Electronics
Exact sciences and technology
Hardware Architecture
Integrated circuits
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
title Exploring the feasibility of selective hardening for combinational logic
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-04T20%3A11%3A10IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-hal_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Exploring%20the%20feasibility%20of%20selective%20hardening%20for%20combinational%20logic&rft.jtitle=Microelectronics%20and%20reliability&rft.au=Pagliarini,%20S.N.&rft.date=2012-09-01&rft.volume=52&rft.issue=9-10&rft.spage=1843&rft.epage=1847&rft.pages=1843-1847&rft.issn=0026-2714&rft.eissn=1872-941X&rft.coden=MCRLAS&rft_id=info:doi/10.1016/j.microrel.2012.06.042&rft_dat=%3Chal_cross%3Eoai_HAL_hal_02942480v1%3C/hal_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_els_id=S0026271412002399&rfr_iscdi=true