Absolute measurement of the nonlinear refractive indices of reference materials

We report absolute measurements of the nonlinear refractive index on carbon disulfide ( CS 2 ) and fused silica. These materials are commonly used as standard references in nonlinear optical experiments. To obtain more accurate values than those usually used, we have combined the z-scan method insid...

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Veröffentlicht in:Journal of applied physics 2009-05, Vol.105 (10), p.103106-103106-5
Hauptverfasser: Boudebs, Georges, Fedus, Kamil
Format: Artikel
Sprache:eng
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Zusammenfassung:We report absolute measurements of the nonlinear refractive index on carbon disulfide ( CS 2 ) and fused silica. These materials are commonly used as standard references in nonlinear optical experiments. To obtain more accurate values than those usually used, we have combined the z-scan method inside a 4-f imaging system (in order to analyze the spatial distortion of the diffracted pump beam) with the "Kerr shutter" experiment (to evaluate the temporal pulse width durations for three different wavelengths such as 1064, 532, and 355 nm). We obtained surprisingly n 2 values one order of magnitude less than the one usually taken into account in the picosecond regime and a more significant dispersion of the nonlinear refraction index. Experimental and simulated Z-scan transmittance profiles as well as acquired autocorrelation functions in the Kerr-gating experiments are presented here in order to validate our measurements.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.3129680