Thin ferroelectric Nd-doped BiFeO3 films with orthorhombic structure
X-ray diffraction and Raman spectroscopy of epitaxial Nd-doped bismuth ferrite films on MgO substrates reveal their orthorhombic symmetry Fmm 2 ( a = 7.914 Å, b = 7.913 Å, and c = 7.937 Å).
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| Veröffentlicht in: | Bulletin of the Russian Academy of Sciences. Physics 2010-08, Vol.74 (8), p.1112-1114 |
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| container_title | Bulletin of the Russian Academy of Sciences. Physics |
| container_volume | 74 |
| creator | Leontyev, I. N. Anokhin, A. S. Yuzyuk, Yu. I. Golovko, Yu. I. Mukhortov, V. M. Chernyshov, D. Y. Dmitriev, V. P. Janolin, P. -E. Dkhil, B. El-Marssi, M. |
| description | X-ray diffraction and Raman spectroscopy of epitaxial Nd-doped bismuth ferrite films on MgO substrates reveal their orthorhombic symmetry
Fmm
2 (
a
= 7.914 Å,
b
= 7.913 Å, and
c
= 7.937 Å). |
| doi_str_mv | 10.3103/S1062873810080228 |
| format | Article |
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Fmm
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b
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c
= 7.937 Å).</description><subject>Bismuth</subject><subject>Bismuth ferrite</subject><subject>Diffraction</subject><subject>Disorder</subject><subject>Engineering Sciences</subject><subject>Ferroelectric materials</subject><subject>Hadrons</subject><subject>Heavy Ions</subject><subject>Magnesium oxide</subject><subject>Materials</subject><subject>Neodymium</subject><subject>Nuclear Physics</subject><subject>Physics</subject><subject>Physics and Astronomy</subject><subject>Proceedings of the International Symposium “Order</subject><subject>Properties of Oxides (ODPO-12)</subject><subject>Raman spectroscopy</subject><subject>Substrates</subject><subject>Thin films</subject><subject>X-ray diffraction</subject><issn>1062-8738</issn><issn>1934-9432</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><sourceid>BENPR</sourceid><recordid>eNp1kE9LxDAQxYsouK5-AG8FTx6qmfxpkuO6uios7sH1HNoktV26mzVpFb-9KRURxNMMM7_3mHlJcg7oigAi18-Aciw4EYCQQBiLg2QCktBMUoIPYx_X2bA_Tk5C2CDEmMRsktyu62aXVtZ7Z1urO9_o9Mlkxu2tSW-ahV2RtGrabUg_mq5One9q52u3LSMXOt_rrvf2NDmqijbYs-86TV4Wd-v5Q7Zc3T_OZ8tMY-Ai04Al1XkOOTY5pawyxnCGBQOwVDNUQsGFsRIbLhEpOSkJR5xToALKQgCZJpejb120au-bbeE_lSsa9TBbqmEWH89lTuX7wF6M7N67t96GTm1c73fxPBVzAYaAAI0UjJT2LgRvqx9bQGoIVv0JNmrwqAmR3b1a_8v5X9EXJoZ2tg</recordid><startdate>201008</startdate><enddate>201008</enddate><creator>Leontyev, I. 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Fmm
2 (
a
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b
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c
= 7.937 Å).</abstract><cop>Heidelberg</cop><pub>Allerton Press, Inc</pub><doi>10.3103/S1062873810080228</doi><tpages>3</tpages><orcidid>https://orcid.org/0000-0003-3385-5374</orcidid><orcidid>https://orcid.org/0000-0003-4680-4912</orcidid><orcidid>https://orcid.org/0000-0002-9862-625X</orcidid></addata></record> |
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| subjects | Bismuth Bismuth ferrite Diffraction Disorder Engineering Sciences Ferroelectric materials Hadrons Heavy Ions Magnesium oxide Materials Neodymium Nuclear Physics Physics Physics and Astronomy Proceedings of the International Symposium “Order Properties of Oxides (ODPO-12) Raman spectroscopy Substrates Thin films X-ray diffraction |
| title | Thin ferroelectric Nd-doped BiFeO3 films with orthorhombic structure |
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