Thin ferroelectric Nd-doped BiFeO3 films with orthorhombic structure

X-ray diffraction and Raman spectroscopy of epitaxial Nd-doped bismuth ferrite films on MgO substrates reveal their orthorhombic symmetry Fmm 2 ( a = 7.914 Å, b = 7.913 Å, and c = 7.937 Å).

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Bibliographische Detailangaben
Veröffentlicht in:	Bulletin of the Russian Academy of Sciences. Physics 2010-08, Vol.74 (8), p.1112-1114
Hauptverfasser:	Leontyev, I. N., Anokhin, A. S., Yuzyuk, Yu. I., Golovko, Yu. I., Mukhortov, V. M., Chernyshov, D. Y., Dmitriev, V. P., Janolin, P. -E., Dkhil, B., El-Marssi, M.
Format:	Artikel
Sprache:	eng
Schlagworte:	Bismuth Bismuth ferrite Diffraction Disorder Engineering Sciences Ferroelectric materials Hadrons Heavy Ions Magnesium oxide Materials Neodymium Nuclear Physics Physics Physics and Astronomy Proceedings of the International Symposium “Order Properties of Oxides (ODPO-12) Raman spectroscopy Substrates Thin films X-ray diffraction
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Beschreibung
Zusammenfassung:	X-ray diffraction and Raman spectroscopy of epitaxial Nd-doped bismuth ferrite films on MgO substrates reveal their orthorhombic symmetry Fmm 2 ( a = 7.914 Å, b = 7.913 Å, and c = 7.937 Å).
ISSN:	1062-8738 1934-9432
DOI:	10.3103/S1062873810080228