Transmission electron microscopy on metal-organic frameworks - a review

Versatile materials like metal-organic frameworks require careful characterization. Transmission electron microscopy is a very powerful method that can address a multitude of investigative challenges. In this review we present TEM studies that yielded valuable insights into the investigated MOFs to illustrate the potential of TEM despite the sensitivity of MOFs to the electron beam. Versatile materials like MOFs require careful characterization. TEM can be used to determine and identify the crystal structure and surface facets of MOFs, the spatial distribution of guests or building blocks in them and how they are changed in chemical reactions.