Simulation Study of a Novel Current-Limiting Device: A Vertical α-SiC JFET - Controlled Current Limiter
Keyword : Current limiter, JFET, serial protection device, high voltage. Abstract : Considering fault current limiters for serial protection, a lot of structures exist, from regulation to other complex systems such as circuit breakers, mechanical switches or more conventional system : fuses. Up to n...
Gespeichert in:
Veröffentlicht in: | Materials science forum 2002-04, Vol.389-393, p.1243-1246 |
---|---|
Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | Keyword : Current limiter, JFET, serial protection device, high voltage. Abstract : Considering fault current limiters for serial protection, a lot of structures exist, from regulation to other complex systems such as circuit breakers, mechanical switches or more conventional system : fuses. Up to now, only few semiconductor current limiter structures were described in papers [1]. Although Current Regulative Diode components exist [2, 3], the voltage and current capabilities (V BR =100 V, I max =10 mA), do not allow to use them in power systems. A comparison of a silicon Current Regulative Diode (CRD) and an equivalent SiC one demonstrates the thermal and electrical limitations of silicon. This paper deals with a novel bi-directional current limiter structure based on a vertical α-SiC VJFET, with both buried gate and source. This device was designed for short circuit protections. Simulations were performed with ISE-TCAD [4] to evaluate static and transient electrical characteristics of the VJFET, according to several specifications : voltage capability, current rating, time during which the device can sustain a short circuit. Simulations allow geometrical design and doping profile estimation as well as the technological process to realize such a component. Both 6H and 4H-SiC Controlled Current Limiter (CCL) have been realized. Electrical characterizations of fabricated devices underline the limiting effect and the command ability. |
---|---|
ISSN: | 0255-5476 1662-9752 1662-9752 1662-9760 |
DOI: | 10.4028/www.scientific.net/MSF.389-393.1243 |